Microscopy & Microanalysis Tool Set
V-2013090302
Calculates Inelastic Electron Mean Free Path for use in EELS (λ
)
Parameter
Value
units
Mean Atomic Number
(Z)
Accelerating Voltage
(V
o
)
kV
Collection Half Angle
(β)
mR
Measured t/λ
Calculated thickness
(t)
nm
Calculated Meanfree Path
(λ)
nm
Ref: Egerton & Chang, Ultramicroscopy
21
(1987) 231-244
This Tool is written in JavaScript and should be platform Independent.
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EMail:
Zaluzec@Microscopy.Com