Directory of Microscopy & Microanalysis Meetings/ShortCourses/Conferences


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Dates
Meeting/Course and Short Synopsis
Local Date/Time is: 2015 / 5 / 24 @ 3:55
May 19, 2015
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May 22, 2015
Title:15th Annual Meeting of the European Light Microscopy Initiative (ELMI 2015)
Sponsor:
Location:Hotel Melià Sitges **** , Sitges SPAIN
URL: http://www.elmi2015.eu/

  • Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Computational TPM/TPC
  • ELMI2015 combines scientific lectures on state-of-the-art, high-end microscopy with “hands-on” workshops and exhibition of the latest technology.
May 19, 2015
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May 21, 2015
Title:CSU Summer School 2015 Electron Diffraction Methods for Materials Analysis
Sponsor:Colorado State University
Location:Colorado State University , Fort Collins CO United States
URL: http://cif.colostate.edu/cif-summer-school/.

  • CBED TED EBSD OIM Computational Precession Electron Diffraction
  • This 3-day workshop (May 19-21, 2015) will introduce students to different electron diffraction methods for microstructural crystallographic characterization of materials in SEM and TEM. Topics will include: conventional diffraction modes in TEM; precession electron diffraction; and electron backscatter diffraction in SEM
Jun 07, 2015
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Jun 12, 2015
Title:Lehigh Microscopy School
Sponsor:Lehigh University
Location:Lehigh University , Bethlehem PA United States
URL: http://www.lehigh.edu/microscopy

  • SEM LVSEM ESEM TEM STEM CBED EBSD AEM EDS WDS FIB X-Ray Microscopy XRF
  • Forty-fifth anniversary of the Lehigh Microscopy School. All courses, all lecturers, all instrument suppliers will be at Lehigh University for one week (June 7-12, 2015).
Jul 13, 2015
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Jul 14, 2015
Title:Advanced AFM Operation Techniques
Sponsor:AFMWorkshop
Location:AFMWorkshop , Signal Hill United States
URL: http://www.afmworkshop.com/advanced-afm-operation-techniques.html

  • Scanning Probe SPM AFM
  • Attendees learn skills required for measuring high-resolution AFM images (<1nm). Blends lecture & hands-on lab time with a variety of samples. Users with any make or model of AFM will benefit. Led by AFM experts Peter Eaton, Ph.D. and Paul West, Ph.D.
Jul 16, 2015
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Jul 17, 2015
Title:Bioapplications with AFM
Sponsor:AFMWorkshop
Location:AFMWorkshop , CA United States
URL: http://www.afmworkshop.com/afm-bioapplications.html

  • Scanning Probe SPM AFM
  • AFMs enable advanced measurements of biological samples that are not possible with other microscopy techniques. The workshop mixes lecture w/hands-on labs covering sample prep; imaging in air and liquid; measuring F/Distance curves. Led by AFM experts Peter Eaton Ph.D. & Paul West Ph.D.
Aug 02, 2015
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Aug 06, 2015
Title:Microscopy & Microanalysis 2015
Sponsor:MSA, MAS, IMS
Location:Portland Convention Center , Portland OR United States
URL: http://microscopy.org

  • Light/Optical MultiPhoton IR/Raman Fluorescence Near Field NSOM Scanning Probe SPM STM AFM MFM SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD OIM Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES SIM SIMS FIM AtomProbe FIB X-Ra
  • Worlds Largest Annual Meeting encompassing Microscopy & Microanalysis - sponsored by the Microscopy Society of America, Microbeam Analysis Society, and joined by the International Metallographic Society. M&M 2015 is a unique community of scientists and technology providers from a wide variety of fields, from all over the world. Each year the meeting gets better and more comprehensive, as we enhance and strengthen the Societies that come together to share and collaborate on scientific knowledge.
Oct 04, 2015
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Oct 08, 2015
Title:Materials Science and Technology 2015
Sponsor:Francisco Sola
Location:Greater Columbus Convention Center , Columbus OH United States
URL: http://www.programmaster.org/PM/PM.nsf/UpcomingSymposia/D5D611F23532

  • SEM LVSEM ESEM LEEM TEM HREM STEM SCEM IVEM/HVEM CBED TED EBSD Tomography Holography Lorentz Insitu AEM ELS EDS WDS EMPA AES ESCA SIM AtomProbe FIB Computational
  • The Materials Science and Technology 2015 (MS&T15) symposium on Electron and Focused Ion Beam Microscopy Tools in Materials Characterization will be held October 4-8, 2015, in Columbus, Ohio.

Nestor J. Zaluzec / Zaluzec@aaem.amc.anl.gov